Snežana M. Golubović

full professor

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Snežana Golubović

Academic career

  • Elected full professor in 2006 at the Faculty of Electrical Engineering in Niš, in the field of Applied Physics
  • PhD degree received in 1995 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics
  • Master degree received in 1988 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics
  • Bachelor degree received in 1981 at the Faculty of Philosophy in Niš, in the field of Physics

References

  • S. Dimitrijev, S. Golubović, D. Župac, M. Pejović, and N. Stojadinović, Solid-State Electronics, Vol. 32 (5), pp. 349-353 (1989).
  • S. Golubović, M. Pejović, S. Dimitrijev, and N. Stojadinović, Physica Status Solidi (a), Vol. 129, pp. 569-575 (1992).
  • G. Ristić, S. Golubović, and M. Pejović, Electronics Letters, 29, p. 1644 (1993).
  • M. Pejović, S. Golubović, G. Ristić, and M. Odalović, Solid-State Electronics, Vol. 37 (1), pp. 215-216 (1994).
  • N. Stojadinović, S. Djorić, S. Golubović, and V. Davidović, Electronics Letters, Vol. 30, pp. 1192-1193 (1994).
  • S. Golubović, G. Ristić, M. Pejović, and S. Dimitrijev, Physica Status Solidi (a), Vol. 143, pp. 333-338 (1994).
  • G. Ristić, S. Golubović, and M. Pejović, Appl. Phys. Lett., Vol. 66, pp. 88-89 (1995).
  • S. Golubović, S. Djorić-Veljković, V. Davidović and N. Stojadinović, Jpn. J. Appl. Phys., Vol. 38 (1), pp. 4699-4702 (1999).
  • N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović, S. Dimitrijev, Microelectron. Reliab., Vol. 45, pp. 115-122 – invited paper (2005).
  • D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, N. Stojadinović, Microelectron.Reliab., Vol. 46, pp. 1828-1833 (2006)
  • N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović, IEE Proc. Circuits, Devices and Systems, Vol. 153, pp 281-288 (2006).
  • I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, , IET Circuits, Devices and Systems, vol. 2, no. 2, pp. 213-221 (2008)
  • V. Davidović, N. Stojadinović, D. Dankovi ć, S. Golubović, I. Manić, S. Djorić-Veljković, and S. Dimitrijev, Japanese J. Appl. Phys, Vol. 47, pp. 6272-6276 (2008)
  • D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, and N. Stojadinović, Microelectronics Reliability, vol. 48, no. 8-9, pp. 1313 - 1317 (2008)
  • D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, and N. Stojadinović, "Implications of Negative BiasTemperature Instability in Power MOS Transistors " in Micro Electronic and Mechanical Systems, ISBN: 978-953-307-027-8, edited by Kenichi Takahata, IN-TECH Press, Boca Raton, pp. 19.319-19.342 (2009)
  • I. Manić, D. Danković, S. Djorić-Veljković, V. Davidović, S. Golubović, and N. Stojadinović, Microelectronics Reliability, Vol. 49, no. 9-11, pp. 1003 - 1007 (2009)
  • N. Stojadinović, D. Danković, I. Manić, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, and Z. Prijić, Microelectronics Reliability, Vol. 50, no. 9-11, pp. 1278 - 1282 (2010)
  • S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, and N. Stojadinović, Nuclear Technology & Radiation Protection, Vol. 26, no. 1, pp. 18 - 24 (2011)
  • I. Manić, D. Danković, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, and N. Stojadinović, Microelectronics Reliability, vol. 51, no. 9-11, pp. 1540 - 1543 (2011)

Activities

  • Total number of papers in journals with IMPACT factor: 33
  • Current involvement in projects: National: 1; International: 1
  • Other relevant information:

Contacts us

Address: Aleksandra Medvedeva 14, 18106 Niš

Phone: +381 (18) 529-105

Fax: +381 (18) 588-399

e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

PIB: 100232259

Account number: 840-1721666-89