Aneta P. Prijić

assistant professor

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Aneta Prijić

Academic career

  • Elected assistant professor in 2011 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics and Microsistems
  • PhD degree received in 2007 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics and Microsistems
  • Master degree received in 1996 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics
  • Bachelor degree received in 1993 at the Faculty of Electrical Engineering in Niš, in the field of Microelectronics

References

  • A. Prijić, D. Danković, Lj. Vračar, I. Manić, Z. Prijić, N. Stojadinović, „A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors“, Measurement Science and Technology, Vol. 23, Art. No. 085003, (8pp), 2012.
  • Lj. Vračar, A. Prijić, D. Vučković, Z. Prijić, „Capacitive Pressure Sensing Based Key in PCB Technology for Industrial Applications“, IEEE Sensors Journal, Vol. 12, No. 5, pp. 1496-1503, 2012.
  • I. Manić, D. Danković, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, N. Stojadinović, „NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions”, Microelectronics Reliability, Vol. 51, No. 9, pp. 1540-1543, 2011.
  • N. Stojadinovic, D. Danković; I. Manić; A. Prijić; V. Davidović; S. Đorić-Veljković; S. Golubović, Z. Prijić, „Threshold Voltage Instabilities in p-Channel Power VDMOSFETs Under Pulsed NBT Stress“, Microelectronics Reliability, Vol. 50, No. 9, pp. 1278-1282, 2010.
  • A. Prijić, Z. Prijić, B. Pešić, D. Pantić, S. Ristić, D. Mančić, Z. Petrušić, „Design and Optimization of S-Type Thermal Cuttofs“, IEEE Trans. Components and Packaging Technologies, Vol. 31, No. 4, pp. 904-912, 2008.
  • S. Ristić, Z. Prijić, S. Živanović, S. Mijalković, A. Trajković, „On the Effective Intrinsic Carrier Concentrations and Diffusivities in Heavily Doped Silicon“, Physica Status Solidi (a), Vol. 152, No. 2, pp. 499-509, 1995.
  • D. Danković, I. Manić, V. Davidović, A. Prijić, S. Đorić-Veljković, S. Golubović, Z. Prijić, N. Stojadinović, “Lifetime estimation in NBT-stressed p-channel power VDMOSFETs”, Facta Universitatis, Series: Automatic control and Robotics, University of Niš, Vol. 11, No. 1, pp. 15-23, 2012.
  • A. Prijić, B. Pešić, Z. Prijić, D. Pantić, Z. Pavlović, „Temperature and Yield Stress Characterization of Electric Contacts by 3D Numerical Simulation“, Serbian Journal of Electrical Engineering, Vol. 2, No. 1, pp. 77-91, 2005.
  • A. Prijić, Z. Prijić, D. Vučković, A. Stanimirović, “AADL Modeling of M2M Terminal”, Proc. 27th International Conference on Microelectronics (MIEL2010), pp. 373-376, Niš, Serbia, 2010.
  • S. Ristić, A. Prijić, Z. Prijić, „Transportni procesi u jako dopiranom silicijumu“, Monografija, Univerzitet u Nišu, Elektronski fakultet 2001.

Activities

  • Total number of papers in journals with IMPACT factor: 8
  • Current involvement in projects: National: 2; International:
  • Other relevant information:

Contacts us

Address: Aleksandra Medvedeva 14, 18106 Niš

Phone: +381 (18) 529-105

Fax: +381 (18) 588-399

e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

PIB: 100232259

Account number: 840-1721666-89